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FM-KPFM Imaging

FM-KPFM (Frequency Modulated-Kelvin Probe Force Microscopy) applies an AC signal to the probe at a low frequency, fm, while mechanically driving the probe at its resonant frequency, f0, and uses the amplitude of the 1st sideband at f0 + fm as the error signal to drive a DC voltage that nulls that signal.

FM-KPFM is a TappingMode AFM single-pass technique and, unlike other electric modes, does not use LiftMode. FM-KPFM has higher spatial resolution than Lift Mode Surface Potential Imaging (AM-KPFM) but its signal-to-noise ratio is frequently lower.

FM-KPFM Theory

FM-KPFM Probe Requirements

Bruker recommends PFQNE-AL probes for FM-KPFM measurements.

Sample Preparation

Prepare the sample as described in Electrical Sample Preparation.

FM-KPFM Procedure

 
  1. Mount a sample onto the sample holder.
  2. Mount an appropriate probe into the standard probe holder (see Prepare and Load the Cantilever Holder for details).
  1. Click the Select Experiment icon to open the Select Experiment window, shown in Figure 12.

(Hover over the image to view larger)

Figure 12: The FM-KPFM Select Experiment window

  1. Select the following:
    • Experiment Category: Electrical & Magnetic
    • Experiment Group: Electrical & Magnetic Lift Modes
    • Select Experiment: Surface Potential (FM-KPFM)
 
  1. Click Load Experiment.
  1. Click the Setup icon to open the Setup window.
 
  1. Align the laser on the cantilever and place the crosshair there. See Figure 13.

Figure 13: Align the laser on the cantilever and place the crosshair there.

 
  1. Fast Thermal tuning, used to find the cantilever resonance, is performed when you exit the Setup view. This is made visible by the HDSC window, shown in Figure 14.

Figure 14: The HSDC window, indicating that a cantilever tune operation is underway.

  1. Engage the probe onto the sample
  1. Scan the sample
 
  1. Entering a value in the Potential Offset field adds that value to the measured value in the Potential channel. This can be particularly useful when measuring work functions as this function measures the difference in potential between the probe and the sample - entering the value of the work function of the probe will then provide a direct measurement of work function of the sample.
NOTE: The stored data is unaffected by the Potential Offset. I.e. offline measurements do not see this input.

Figure 15: Potential Offset in the FM-KPFM Potential window

Advanced FM-KPFM Imaging

Automatic frequency selection is the default for FM-KPFM imaging. You may wish, however, to manually select an operating frequency. To do this:

  1. Enter the Expanded mode.
 
  1. Set Freq. Control in the Potential (Interleave), shown in Figure 16, panel to User-defined.

Figure 16: Selecting User-defined Frequency Control

  1. You may then, if you wish, Tune the cantilever.

FM-KPFM Parameters

You may wish to manually adjust the parameters shown in Table 1.

Parameter Description
Lock-In BW Needs to be smaller than twice the Drive 3 Frequency which is fm in Figure 8. This lets the Lock-In respond to f0 while filtering f0 ± fm. If the Lock-In BW is too low, the tracking ability will be reduced. Automatic Freq. Control is thus easier to use than User-defined Freq. Control.
Lock-In2 BW Needs to be larger than four times the Drive 3 Frequency which is fm in Figure 8. This is used to include the first and second harmonics, f0 ± 2fm. Extra bandwidth of Lock-In2 does not degrade image quality as Lock-In3 follows.
Lock-In3 BW Lock-In3, cascaded with Lock-In2, is used for the surface potential feedback.
Drive3 Amplitude Higher Drive3 Amplitudes will result in higher signal-to-noise ratios.

Table 1: Adjustable FM-KPFM parameters

 

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